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Soft x-rays and extreme ultraviolet radiation : principles and applications / David Attwood. p. cm. Includes bibliographical references. ISBN -521-65214-6 (hbk.) 1. Grenz rays. 2. Ultraviolet radiation. I. Title. QC482.G68A88 1999 539.70222 - dc21 99-21078 CIP ISBN


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Soft X-Rays and Extreme Ultraviolet Radiation: Principles and Applications Chapter 6 Homework Problems 6.1 Describe the basic features of microscopic, kinetic, and uid descriptions of a plasma. Give examples of phenomena that require these di erent levels of description.


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Soft X-Rays and Extreme Ultraviolet Radiation Principles and Applications. Search within full text. Get access. Buy a print copy Check if you have access via personal or institutional login.. Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions. IEEE Journal of Quantum Electronics, Vol. 35, Issue. 5, p. 709.


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X-Rays and Extreme Ultraviolet Radiation Principles and Applications. Search within full text. Get access.. 'A very clear, comprehensive and updated presentation of the basic physical properties and applications of XUV and X-ray radiation. I highly recommend the book for graduate students and anyone working in this fast growing field of.


Soft XRays and Extreme Ultraviolet Radiation Principles and Applications by David Attwood

X-Rays and Extreme Ultraviolet Radiation: Principles and Applications Authors: David Attwood Anne Sakdinawat Download citation Abstract With this fully updated second edition, readers will gain a.


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INTRODUCTION 1 1.1 The Soft X-Ray and Extreme Ultraviolet Regions of the Electromagnetic Spectrum 1 1.2 Basic Absorption and Emission Processes 5 1.3 Atomic Energy Levels and Allowed Transitions 10 1.4 Scattering, Diffraction, and Refraction of Electromagnetic Radiation 18 References 21 Homework Problems 23 CHAPTER 2.


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Publisher's summary. This detailed, comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The author begins by presenting the relevant.


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(a) Calculate the δ value of the refractive index of silicon by assuming a semi-classical atomic model with two electrons associated with a K-edge resonance at 1840 eV, eight electrons associated with an L-edge resonance at 99.2 eV, and four electrons associated with a UV resonance at 6 eV.


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X-Rays and Extreme Ultraviolet Radiation Principles and Applications 2nd Edition Authors: David Attwood, University of California, Berkeley Anne Sakdinawat, SLAC National Accelerator Laboratory Date Published: February 2017 availability: In stock format: Hardback isbn: 9781107062894 Rate & review £ 65.99 Hardback Add to cart Add to wishlist


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Summary: "This self-contained, comprehensive book describes the fundamental properties of soft x-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft x-ray biomicroscopy."--BOOK JACKET. "The book will be of interest to graduate students and researchers in engineering.


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It is a region where there are a large number of atomic resonances, leading to absorption of radiation in very short distances, typically measured in nanometers (nm) or micrometers (microns, µm), in all materials. This has historically inhibited the pursuit and exploration of the region.


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This self-contained, comprehensive book describes the fundamental properties of soft x-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft x-ray biomicroscopy.


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This self-contained, comprehensive book describes the fundamental properties of soft x-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft x-ray biomicroscopy.


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Soft X-Rays and Extreme Ultraviolet Radiation: Principles and Applications Chapter 8 Homework Problems 8.1 (a) Use Heisenberg's uncertainty principle for transverse position and momentum to derive the limiting phase space condition for radiation of wavelength λ d·θ ≥ λ/2π


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With this fully updated second edition, readers will gain a detailed understanding of the physics and applications of modern X-ray and EUV radiation sources. Taking into account the most recent improvements in capabilities, coverage is expanded to include new chapters on free electron lasers (FELs), laser high harmonic generation (HHG), X-ray and EUV optics, and nanoscale imaging; a completely.